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Raman Investigation of Swift Heavy Ion Irradiated NiO Thin Films

Pravanjan Mallick, N.C. Mishra

Abstract


The 200 MeV Ag15+ ion irradiation induced microstructural modification on NiO films (200 nm thick) was probed by micro-Raman spectrophotometer. As indicated from Raman spectra, the intensity of 1P mode of Raman spectra increases with increasing ion fluence up to 1 1013 ions cm2 and remains almost identical thereafter. The intensity of 2P mode increases for the film irradiated with the fluence of 3 1012 ions cm2 and does not show monotonic variation with ion irradiation. The 2M band decreased slightly towards the lower energy when the film irradiation at a fluence of 3 1012 ions cm2. Beyond the fluence of irradiation the 2M band shift towards the much lower energy and remains almost constant up to the highest fluence of irradiation. The observed shift of 2M band of NiO to lower energies with increasing ion fluence indicated the thermal spike induced heating effect. The decrease of intensity of 2M band with ion fluence indicated the formation of smaller crystallites. The results obtained from Raman analyses in our case were explained on the basis of reported results for thermally treated NiO samples. These observations confirm the applicability of thermal spike model for ion-matter interaction to our case.

Keywords: ion irradiation, microstructure, micro-Raman, thermal spike model, NiO
PACS No: 61.80.Jh; 61.82.Rx; 61.85. +p; 61.82.Ms; 68.55.Ac; 68.55.jm

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DOI: https://doi.org/10.37628/ijssm.v1i2.7

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