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Electronic Speckle Pattern Interference Techniques for Quantifying Deformations

KM Alti, PP Padghan

Abstract


Electronic speckle pattern interference (ESPI) is a popular optical technique to measure deformation or roughness of a surface or an object. However, deformation is not directly measurable from speckle patterns obtained by ESPI. Over the years, number of methods has
been deployed to extract phase and hence amount of deformation from the speckle pattern. In the present paper, we intend to review these methods.

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References


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